Generic selectors
Exact matches only
Search in title
Search in content
Search in posts
Search in pages
Filter by Categories
nmims post
Objective Type Set
Online MCQ Assignment
Question Solution
Solved Question
Uncategorized

Multiple choice question for engineering

Set 1

1. Which of the following indicate leakages in a condenser?
a) Concentration of sodium in steam and condensate are very high
b) Concentration of sodium in steam and condensate are very low
c) Concentration of sodium in steam and condensate are equal
d) Concentration of sodium in steam and condensate are not equal

View Answer

Answer: d [Reason:] If the concentration of sodium in steam and condensate are not equal, it means that a leakage is present in the condenser. If the values are equal, then it means that no leakage is present.

2. Which of the following are added for pH adjustment in sodium analyser?
a) Acidic solution
b) Basic solution
c) Hydrazine
d) Ammonia buffer

View Answer

Answer: d [Reason:] Ammonia buffer is added for pH adjustment in sodium analyser. This is added to the reference and sample solutions.

3. Normally, electrodes measure which of the following parameters?
a) Activity
b) Activity co-efficient
c) Blank constant
d) Ionic co-efficient

View Answer

Answer: a [Reason:] Normally, electrodes measure activity of the ion. It is a measure of free ions in the solution.

4. Which of the following represent concentration of a solution?
a) Only free ions
b) Only bound ions
c) Free ions and bound ions
d) Either free ions or bound ions

View Answer

Answer: c [Reason:] Concentration refers to the sum of free ions and bound ions. Activity refers only to free ions.

5. Sodium selective electrode provides good response in measurement when the pH is above which of the following values?
a) 2
b) 3
c) 5
d) 10

View Answer

Answer: d [Reason:] Sodium selective electrode provides good response in measurement when the pH of the solution is above 10. Hence, buffer solution is used.

6. Which of the following are used to free bound ions or liberate bound ions?
a) Colouring agents
b) Ammonia Buffer
c) Reagents
d) Iodine solution

View Answer

Answer: c [Reason:] Reagents are used to free bound ions or liberate bound ions. The addition of reagent prevents unwanted ions from entering into the measurement.

7. In which part of the apparatus are the reference and ion selective electrodes placed?
a) Head tank
b) Flow cell
c) Reservoir
d) Solenoid valve

View Answer

Answer: b [Reason:] The reference and ion selective electrodes are placed in the flow cell. Sample is maintained in the constant head tank.

8. The output of the electrode in sodium analyser is proportional to which of the following parameters?
a) Activity
b) Concentration
c) Negative logarithm of sodium ion concentration
d) Logarithm of sodium ion concentration

View Answer

Answer: d [Reason:] The output of the electrode in sodium analyser is proportional to logarithm of sodium ion concentration. The value is recorded and indicated.

9. Cleaning process gives accuracy and long life.
a) True
b) False

View Answer

Answer: a [Reason:] Cleaning process gives accuracy and long life. Spray nozzles can be used to clean the electrodes.

10. Presence of sodium sulphate in water causes corrosion in boilers.
a) True
b) False

View Answer

Answer: a [Reason:] Presence of sodium sulphate in water causes corrosion in boilers. Sodium hydroxide and sodium chloride salts also cause corrosion.

Set 2

1. Surface is usually more than _____ atomic layer deep and is a region of ________ atomic potentials.
a) One, uniform
b) One, non-uniform
b) Two, uniform
d) Two, non-uniform

View Answer

Answer: b [Reason:] Surface is more than one atomic layer deep and is a region of non-uniform atomic potentials. The outermost layer of atoms is called as surface.

2. Surface analysis can provide information that classic methods like microscopic cannot.
a) True
b) False

View Answer

Answer: a [Reason:] Surface analysis can provide information that classic methods like microscopic cannot. It is better than reflectivity, adsorption isotherms, etc.

3. In surface spectrometer, which of the following beam is analysed?
a) Reflected beam
b) Absorbed beam
c) Refracted beam
d) Incident beam

View Answer

Answer: a [Reason:] When a beam is focussed on a surface, one beam enters the material and a second beam is reflected. The reflected beam is analysed.

4. Which of the following is a type of electron spectroscopy?
a) MIKES
b) Auger spectroscopy
c) Secondary ion mass spectroscopy
d) Ion scattering spectroscopy

View Answer

Answer: b [Reason:] Auger spectroscopy is a type of electron spectroscopy. Electron spectroscopy for chemical analysis is also a type of electron spectroscopy.

5. Surface analysis cannot provide any chemical information directly.
a) True
b) False

View Answer

Answer: b [Reason:] Surface analysis can provide chemical information. Electron and ion spectroscopic techniques are types of surface analysis.

6. Which of the following is also known as X-ray photoelectron spectroscopy?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

View Answer

Answer: c [Reason:] Electron spectroscopy for chemical analysis is also known as X-ray photoelectron spectroscopy. It is an effective technique for detecting the elements.

7. Which of the following methods utilizes the emission of low energy electrons in a process?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

View Answer

Answer: a [Reason:] Auger electron spectroscopy utilizes the emission of low energy electrons in auger process. It is one of the commonly employed techniques.

8. Which of the following is the abbreviation of ESCA?
a) Electron scattering chemical analysis
b) Emission spectroscopy combination analysis
c) Electron spectroscopy for chemical analysis
d) Electron spectrum chemically analysed

View Answer

Answer: c [Reason:] The abbreviation of ESCA is Electron spectroscopy for chemical analysis. It is a type of electron spectroscopy.

9. Which of the following methods use soft X-rays to eject electrons from inner shell orbitals?
a) Auger electron spectroscopy
b) Electron impact spectroscopy
c) Electron spectroscopy for chemical analysis
d) Secondary ion mass spectroscopy

View Answer

Answer: c [Reason:] Electron spectroscopy for chemical analysis use soft X-rays to eject electrons from inner shell orbitals. It is a type of electron spectroscopy.

10. Which of the following is the abbreviation of SIMS?
a) Secondary ion mass spectroscopy
b) Spectrum ionization mass spectroscopy
c) Scattering ions mass spectroscopy
d) Spectral ionization mass spectroscopy

View Answer

Answer: a [Reason:] Secondary ion mass spectroscopy is the abbreviation of SIMS. It is a type of ion spectroscopy.

Set 3

1. Which of the following is not a type of NMR spectrometer?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: b [Reason:] Maximal type is not a type of NMR spectrometer. Minimal type, Multipurpose type and Wideline type are types of NMR spectrometer.

2. Which of the following NMR spectrometers have stressed reliability and ease of operation?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: a [Reason:] Minimal type has stressed reliability and ease of operation. It uses a permanent magnet.

3. Which of the following type of NMR spectrometer uses a frequency synthesizer to generate RF fields?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: c [Reason:] Wideline type NMR spectrometer uses a frequency synthesizer to generate RF fields. It is a type of continuous wave NMR spectrometer.

4. In wideline NMR spectrometers, which of the following has to be supplied to the electromagnet?
a) Slowly varying low voltage
b) Rapidly varying low voltage
c) Slowly varying scan voltage
d) Rapidly varying scan voltage

View Answer

Answer: c [Reason:] In wideline NMR spectrometers, slowly varying scan voltage has to be supplied to the electromagnet. This is injected using a regulator.

5. Which among the following NMR spectrometer is the more diverse spectrometer?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: c [Reason:] Multipurpose type NMR spectrometer is more diverse. These instruments are designed mainly for research.

6. Permanent magnet cannot be used in wideline type NMR spectrometer.
a) True
b) False

View Answer

Answer: b [Reason:] Permanent magnet can be used in wideline type NMR spectrometer. Compact, light-weight electromagnet can also be used.

7. Which of the following NMR spectrometer emphasises on high performance versatility with cost being a secondary consideration?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: c [Reason:] Multipurpose type is mainly used for research. Hence, it emphasises on high performance versatility with cost being a secondary consideration.

8. Which of the following NMR spectrometer does not require power supply and cooling system?
a) Minimal type
b) Maximal type
c) Multipurpose type
d) Wideline type

View Answer

Answer: a [Reason:] Minimal type NMR spectrometer uses a permanent magnet. Hence, it does not require power supply and cooling system.

9. Minimal type NMR spectrometer is inexpensive.
a) True
b) False

View Answer

Answer: a [Reason:] Minimal type NMR spectrometer is inexpensive. It uses a permanent magnet and does not require a power supply.

10. Which of the following is used as coolant for magnets in continuous-wave NMR spectrometer?
a) Water
b) Liquid He
c) Liquid Na
d) Heavy water

View Answer

Answer: a [Reason:] Water is used as coolant for magnets in continuous-wave NMR spectrometer. Liquid He is used for FT-NMR spectrometers.

Set 4

1. X-ray diffractometers are not used to identify the physical properties of which of the following?
a) Metals
b) Liquids
c) Polymeric materials
d) Solids

View Answer

Answer: b [Reason:] X-ray diffractometers are not used to identify the physical properties of liquids. It is used to identify the physical properties of metals, solids and polymeric materials.

2. X-ray diffractometers provide ____________ information about the compounds present in a solid sample.
a) Quantitative
b) Qualitative
c) Quantitative and qualitative
d) Either quantitative or qualitative

View Answer

Answer: c [Reason:] X-ray diffractometers provide quantitative and qualitative information about the compounds present in a solid sample.

3. Using powder method of diffractometers, which of the following can be determined?
a) Percentage of K+
b) Percentage of Na+ and Cl-
c) Percentage of KBr and NaCl
d) Percentage of Br-

View Answer

Answer: c [Reason:] Using powder method of diffractometers, percentage of KBr and NaCl can be determined. Other analytical methods provide only percentage of K+, Na+, Cl- and Br-.

4. In powder method, the powder sample is contained in which of the following?
a) Thin walled glass capillary tubes
b) Thin walled test tube
c) Thin walled curvettes
d) Thin walled flask

View Answer

Answer: a [Reason:] In powder method, the powder sample is contained in thin walled glass capillary tubes. Thin walled cellophane capillary tubes can also be used.

5. Which of the following is the most common instrument for photographic recording of diffraction patterns?
a) Debye-Scherrer powder camera
b) Gamma camera
c) Geiger tube
d) Scintillation counter

View Answer

Answer: a [Reason:] Diffracted x-ray beam can be detected photographically or by using scintillation counter or Geiger tube. Debye-Scherrer powder camera is the most common instrument for photographic recording of diffraction patterns.

6. With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle?
a) Coolidge equation
b) Bragg’s equation
c) Debye equation
d) Scherrer equation

View Answer

Answer: b [Reason:] The distance is calculated from known wavelength of the source and measured angle using Bragg’ equation. The diffracted angle is calculated by the spacing between a particular set of plane.

7. In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________.
a) Number, length
b) Number, intensity
c) Position, length
d) Position, intensity

View Answer

Answer: d [Reason:] The identification of a component of the from its powder diffraction pattern is based upon the position of lines and their relative intensities. Diffractometers are used for powder diffraction.

8. When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam.
a) True
b) False

View Answer

Answer: a [Reason:] When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam. The relationship among different factors is given by Bragg’s law.

9. Diffractometers are similar to which of the following?
a) Optical grating spectrometer
b) Prism spectrometer
c) Photo multiplier
d) Photovoltaic cell

View Answer

Answer: a [Reason:] Diffractometers are similar to optical grating spectrometers. The differences are that lenses and mirrors are not used with X-rays.

10. In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates.
a) Number
b) Position
c) Length
d) Distance between lines

View Answer

Answer: a [Reason:] In Diffractometers, line intensities depend on number and kind of atomic reflection centres in each set of plates. Diffraction is a wave property of electromagnetic radiation.

11. In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.
a) True
b) False

View Answer

Answer: a [Reason:] In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture. Hence, they are used in qualitative analysis.

12. In powder diffractometer, the sharpness of the lines is greatly determined by which of the following?
a) Quality of the sample, size of the slit
b) Quality of the slit, size of the sample
c) Thickness of the slit, amount of the sample
d) Number of slits, composition of the sample

View Answer

Answer: b [Reason:] In powder diffractometer, the sharpness of the lines is greatly determined by the quality of the slit and the size of the sample. The slit should be able to produce a fine beam.

Set 5

1. If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a long or a short time, the phenomenon is termed as which of the following?
a) Luminescence
b) Fluorescence
c) Phosphorescence
d) Spontaneous emission

View Answer

Answer: a [Reason:] If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a short or a long time, the phenomenon is termed as luminescence. Usually, absorption of electromagnetic radiation results in emission of radiation.

2. If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a short time, the phenomenon is termed as which of the following?
a) Luminescence
b) Fluorescence
c) Phosphorescence
d) Spontaneous emission

View Answer

Answer: b [Reason:] If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a short time, the phenomenon is termed as fluorescence. Fluorescence emissions are characteristic of the particular element.

3. If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a long time, the phenomenon is termed as which of the following?
a) Luminescence
b) Fluorescence
c) Phosphorescence
d) Spontaneous emission

View Answer

Answer: c [Reason:] If the absorption of electromagnetic radiation by matter results in the emission of radiation of same or longer wavelengths for a long time, the phenomenon is termed as phosphorescence. Phosphorescence is a type of luminescence.

4. Prompt emission of X-ray by an atom ionised by a higher energy X-ray is a type of which of the following phenomena?
a) Luminescence
b) Fluorescence
c) Phosphorescence
d) Spontaneous emission

View Answer

Answer: b [Reason:] Prompt emission of X-ray by an atom ionised by a higher energy X-ray is a type of fluorescence. Fluorescence emissions are characteristic of the particular element.

5. The measurement of intensity of fluorescent X-rays provide a simple and ____________ way of _____________ analysis. Fill in the blanks.
a) Destructive, quantitative
b) Non-destructive, quantitative
c) Destructive, qualitative
d) Non-destructive, qualitative

View Answer

Answer: b [Reason:] The measurement of intensity of fluorescent X-rays provide a simple and non-destructive way of quantitative analysis.

6. The energy of the emitted X-rays depends upon the _________ of the atom and their intensity depends upon the __________
a) Atomic number, amount of sample
b) Mass number, amount of sample
c) Mass number, concentration of atoms
d) Atomic number, concentration of atoms

View Answer

Answer: d [Reason:] The energy of the emitted X-rays depends upon the atomic number of the atom and their intensity depends upon the concentration of atoms in the sample. X-ray fluorescence spectroscopy is based on this principle.

7. Which of the following is Mosely’s equation if ‘C’ is the speed of light, ‘a’ is proportionality constant, ‘σ’ is a constant which depends on electronic transition series, ‘Z’ is the atomic number and ‘λ’ is the wavelength?
a) Cλ= a(Z-σ)2
b) C/λ= a(Z-σ)2
c) C(Z-σ)2= aλ
d) C(Z-σ)2= a/λ

View Answer

Answer: b [Reason:] The Mosely’s equation is, C/λ= a(Z-σ)2. It gives the relationship between speed of light, reciprocal of wavelength and atomic number.

8. The problem of spectral interference is not severe in X-ray spectroscopy.
a) True
b) False

View Answer

Answer: a [Reason:] The problem of spectral interference is not severe in X-ray spectroscopy. This is due to the relative simplicity of the X-ray spectra.

9. In X-ray fluorescence spectrometer, the relationship between the excitation intensity and the intensity of fluorescence does not depend on which of the following?
a) Spectrum of the incident radiation
b) Angle of radiance
c) Molecular weight
d) Incident angle

View Answer

Answer: d [Reason:] In X-ray fluorescence spectrometer, the relationship between the excitation intensity and the intensity of fluorescence does not depend on the incident angle. It depends on absorption of path length.

10. Fluorescent X-ray spectrometers would require only moderate-intensity X-ray tubes.
a) True
b) False

View Answer

Answer: b [Reason:] Fluorescent X-ray spectrometers would require high-intensity X-ray tubes. They also require sensitive detectors and suitable X-ray optics.

.woocommerce-message { background-color: #98C391 !important; }